Bulk transfer of storage devices using manual loading

ABSTRACT

A storage device transfer station is provided for transferring storage devices from a human operator to automated machinery for testing. The storage device transfer station includes a plurality of slots each capable of holding a storage device. The plurality of slots is arranged in at least one field, and the field is arranged between two parallel planes. Each slot has a first open end and a second open end, such that each open end is accessible for loading and unloading a storage device. The first open ends are accessible at a first plane of the two parallel planes and the second open ends are accessible at a second plane of the two parallel planes.

TECHNICAL FIELD

This disclosure relates to bulk transfer of storage devices to and fromstorage device testing systems and transfer stations for storage devicetesting systems.

BACKGROUND

Storage device manufacturers typically test manufactured storage devicesfor compliance with a collection of requirements. Test equipment andtechniques exist for testing large numbers of storage devices seriallyor in parallel. Manufacturers tend to test large numbers of storagedevices simultaneously. Storage device testing systems typically includeone or more racks having multiple test slots that receive storagedevices for testing.

Current storage device testing systems use an operator, a robotic arm,or a conveyer belt to individually feed storage devices to a transferlocation for loading into the testing system for testing. Other currentstorage device testers use a tote or a mobile tote to load or unloadmultiple storage devices to a transfer location at the same time. Arobotic arm of the testing system retrieves the storage devicesindividually or in small batches from the transfer location and loadsthem in test slots for testing.

SUMMARY

In general, this disclosure relates to the bulk transfer of storagedevices using manual loading.

In one aspect, a storage device transfer station is provided fortransferring storage devices from a human operator to automatedmachinery for testing. The storage device transfer station includes aplurality of slots each capable of holding a storage device. Theplurality of slots is arranged in at least one field arranged betweentwo parallel planes. Each slot has a first open end and a second openend, such that each open end is accessible for loading and unloading astorage device. The first open ends are accessible at a first plane ofthe two parallel planes and the second open ends are accessible at asecond plane of the two parallel planes.

In another aspect, a storage device testing system is provided fortesting storage devices. The storage device testing system includes astorage device transfer station for transferring storage devices from ahuman operator to automated machinery. The storage device transferstation includes a plurality of slots each capable of holding a storagedevice. The plurality of slots is arranged in at least one fieldarranged between two parallel planes. Each slot has a first open end anda second open end, such that each open end is accessible for loading andunloading a storage device. The first open ends are accessible at afirst plane of the two parallel planes and the second open ends areaccessible at a second plane of the two parallel planes. The storagedevice testing system also includes automated machinery configured toaccess the second open end of at least one of the plurality of slots.

According to another aspect, a method of testing storage devicesincludes manually loading a plurality of storage devices into aplurality of slots of a storage device transfer station; actuatingautomated machinery to transfer a plurality of the storage devicesbetween the plurality of slots of the storage device transfer stationand the plurality of slots of the storage device transfer station; andmanually unloading a plurality of storage devices from a plurality ofslots of the storage device transfer station.

Embodiments of the disclosed methods, systems and devices may includeone or more of the following features.

The storage device transfer station can include at least one doorcovering at least a portion of the first plane. The door can be capableof locking and unlocking, including automatic locking and unlocking. Atleast one of the slots can have a stop, and the door can includeresilient material or another mechanism arranged to push a storagedevice against the stop when the door is closed. The slots could bearranged to align a storage device in the horizontal or verticaldirections.

In some implementations, the storage device transfer station hasmultiple doors covering the first plane.

In some embodiments, the plurality of slots could be arranged to receivea storage device at the first plane from a human operator, and theplurality of slots could be arranged to provide a storage device at thesecond plane to automated machinery.

In some configurations, the at least one field has at least 125 slots.In some configurations, the field has one or more vertically stackedrows. The slot could be arranged to prevent contact between a humanoperator and the automated machinery. In some embodiments, the storagedevice transfer station could have a door covering a portion of thefirst plane and configured to signal the automated machinery to restrictits movement while the door is open.

Methods can be carried out such that the automated machinery's movementis restricted while the plurality of storage devices is being manuallyloaded or unloaded. Methods can be carried out such that the manualloading of a plurality of storage devices into a plurality of slots of astorage device transfer station includes loading the storage devicesinto a subset of the slots of a storage device transfer station. Methodscan include sorting the plurality of storage devices to group storagedevices with substantially similar test results together.

Embodiments can include one or more of the following advantages.

Embodiments of the disclosed systems, methods, and devices can help toreduce human operator wait time associated with loading and unloadingstorage devices into/from a storage device testing system. For example,in some embodiments, a bulk load/unload transfer station can allow ahuman operator to load/unload many storage devices into a testing systemat once, thereby freeing the operator to perform other tasks betweenload/unload operations.

A bulk load and/or unload system can also afford more opportunity toimprove the handling of storage devices. For example, if one humanoperator loads many storage devices at once, e.g., sequentially during asingle loading operation of limited duration, the number ofopportunities to introduce storage device presentation errors is reducedas compared to loading storage devices continuously over an extendedperiod of time.

A bulk load and/or unload system can also improve the efficiency ofautomated machinery, by allowing the automated machinery to load orunload storage devices to/from many transfer station slots, withoutwaiting for a human operator to remove or present a storage device tothe automated machinery.

A bulk load and/or unload system can also allow for automated sorting ofoutput storage devices into different fields, queues or containers.

In some embodiments, the disclosed systems, methods, and devices canallow a large number of storage devices to be queued for input and/oroutput.

Some embodiments do not require the use of any custom containers ortotes to carry the storage devices. The cost of registering the storagedevices in space and making the storage device presentation compatiblewith automated machinery is only incurred in the feeding station, andnot in every tote.

In some embodiments, the disclosed systems, methods, and devices providemeans of achieving many of the benefits of a fully automated factory(e.g., reliability, repeatability, and density) using a manual, yet bulkoriented input/output station.

Bulk feeding of storage devices can help to provide for increasedthroughput by reducing the amount of human intervention.

Bulk feeding of storage devices can help to provide for increasedthroughput by limiting the amount of human intervention to discrete andspaced apart intervals of time. This can help to reduce presentationerror by reducing the likelihood that an operator will lose attention orfocus over time, e.g., as compared to a system in which an operatorcontinuously feeds storage devices into the system (or removes storagedevices therefrom) over an extended period of time.

In some embodiments, many storage devices may be accessed at the sametime. This makes the load/unload time very fast. In some embodiments,multiple operators could load and unload, further increasing efficiency.

In some embodiments, sorting or binning of storage devices is possibleby the use of multiple doors. One door may enclose all passed storagedevices while another encloses all failed storage devices. Any number ofdoors could be used.

Bulk feeding of storage devices in transfer stations is veryspace-efficient because no internal transport mechanisms are required.The depth of a transfer station can be as little as the depth of astorage device. The lack of transport mechanisms also improves thereliability of a transfer station compared to transfer stations withautomated transport mechanisms.

Some embodiments use no moving parts.

Other aspects, features, and advantages are in the description,drawings, and claims.

DESCRIPTION OF DRAWINGS

FIG. 1 is a perspective view of a storage device testing system and atransfer station.

FIG. 2 is a top view of a storage device testing system and a transferstation.

FIG. 3 is a perspective view of a storage device testing system and atransfer station.

FIGS. 4A and 4B are side views of a transfer station of a storage devicetesting system.

FIG. 5 is a perspective view of a storage device transporter and astorage device receptacle.

FIG. 6 is a top view of a storage device testing system and transferstations.

FIG. 7 is a perspective view of a storage device being inserted into atest slot of a storage device testing system.

FIG. 8 is a perspective view of a storage device transporter.

FIG. 9 is a perspective view of a storage device transporter carrying astorage device.

FIG. 10 is a bottom perspective view of a storage device transportercarrying a storage device.

Like reference symbols in the various drawings indicate like elements.

DETAILED DESCRIPTION

System Overview

A storage device, as used herein, includes disk drives, solid statedrives, memory devices, and any device that benefits from asynchronousprocesses in manufacturing or test. A disk drive is generally anon-volatile storage device that stores digitally encoded data onrapidly rotating platters with magnetic surfaces. A solid-state drive(SSD) is a data storage device that uses solid-state memory to storepersistent data. An SSD using SRAM or DRAM (instead of flash memory) isoften called a RAM-drive. The term solid-state generally distinguishessolid-state electronics from electromechanical devices.

Referring to FIGS. 1-3, in some implementations, a storage devicetesting system 100 includes at least one automated transporter 200 (e.g.robotic arm, gantry system, or multi-axis linear actuator) defining afirst axis 205 (see FIG. 3) substantially normal to a floor surface 10.In the examples shown, the automated transporter 200 comprises a roboticarm 200 operable to rotate through a predetermined arc about the firstaxis 205 and to extend radially from the first axis 205. The robotic arm200 is operable to rotate 360° about the first axis 205 and includes amanipulator 212 disposed at a distal end of the robotic arm 200 tohandle a storage device 500 and/or a storage device transporter 550carrying the storage device 500 (see e.g. FIGS. 8-10). Multiple racks300 are arranged around the robotic arm 200 for servicing by the roboticarm 200. Each rack 300 houses multiple test slots 310 configured toreceive storage devices 500 for testing. The robotic arm 200 defines asubstantially cylindrical working envelope volume 210, with the racks300 being arranged within the working envelope 210 for accessibility ofeach test slot 310 for servicing by the robotic arm 200. Thesubstantially cylindrical working envelope volume 210 provides a compactfootprint and is generally only limited in capacity by heightconstraints. In some examples, the robotic arm 200 is elevated by andsupported on a pedestal or lift 250 (see FIG. 3) on the floor surface10. The pedestal or lift 250 increases the size of the working envelopevolume 210 by allowing the robotic arm 200 to reach not only upwardly,but also downwardly to service test slots 310. The size of the workingenvelope volume 210 can be further increased by adding a verticalactuator to the pedestal or lift 250.

The automated transporter 200 is configured to independently serviceeach test slot 310 to provide a continuous flow of storage devices 500through the testing system 100. A continuous flow of individual storagedevices 500 through the testing system 100 allows varying start and stoptimes for each storage device 500, whereas other systems that requirebatches of storage devices 500 to be run all at once must all have thesame start and end times. Therefore, with continuous flow, storagedevices 500 of different capacities can be run at the same time andserviced (loaded/unloaded) as needed.

Referring to FIG. 3, the storage device testing system 100 includes atransfer station 400 configured for bulk feeding of storage devices 500to the automated transporter 200. The automated transporter 200independently services each test slot 310 by transferring a storagedevice 500 between the transfer station 400 and the test slot 310. Thetransfer station 400 has one or more access ports 410 each allowing anoperator to load and unload multiple storage devices 500 presented forservicing by the automated transporter 200. The transfer station 400 isa service point for delivering and retrieving storage devices 500 to andfrom the storage device testing system 100. Each access port 410 allowsan operator to deliver and retrieve a portion or all of a collection 600of storage devices 500 to and from the transfer station 400. Storagedevices 500 are accessible by an operator at an outer plane 402 (FIG. 2)of the transfer station 400 and accessible by an automated transporter200 at an inner plane 404 (FIG. 2) of the transfer station 400. Theouter plane 402 and inner plane 404 are substantially parallel to eachother. Each collection 600 includes individual storage devicereceptacles 620 or slots into which the storage devices 500 are loadedand out of which the storage devices 500 are unloaded. Someimplementations of the storage device receptacles are configured toreceive storage device transporters 550 (see FIGS. 8-10) each containingstorage devices 500.

In some implementations, a collection 600 may take the form of one ormore vertically stacked rows of storage device receptacles 620. Thenumber of storage device receptacles 620, and corresponding storagedevices 500, could be as few as one or as many as 125 (e.g. 25vertically stacked rows of 5) or more. In the example where the numberof drives in the collection 600 is 125, an operator could load or unloadthe entire collection of drives in about ten minutes.

In some examples, an operator manually loads a plurality of storagedevices 500 into the collection 600 in the transfer station 400. Therobotic arm 200 may continuously unload the storage devices 500 andplace them into test slots 310 for testing, and may also continuouslytransfer tested storage devices 500 from test slots 310 to storagedevice transfer station receptacles 620. During this time, the operatorcan leave and engage in other tasks, e.g., loading and unloading otherstorage devices 500 in a different transfer station 400 or testingsystem 100. Once a quantity of storage devices 500 have been tested andplaced back into the transfer station 400, the operator can return tothe transfer station 400 and unload the storage devices 500.

In the example shown in FIG. 3, each collection 600 is accessible fromthe inner plane 404 of the transfer station 400 in a presentationposition and may be designated as a source collection 600 of storagedevices 500 for testing or as a destination collection 600 of testedstorage devices 500 (or both or some combination thereof). Destinationcollections 600 may be classified as “passed return collections” or“failed return collections” for receiving respective storage devices 500that have either passed or failed a functionality test, respectively.Alternatively, in some implementations, a single collection 600 maycontain storage devices 500 of multiple statuses and could be sortedaccording to status. For example, all of the storage devices 500 placedby the robotic arm 200 at one access port 410 associated with thecollection 600 may all be drives that have passed the functionality test(or otherwise had substantially similar test results), while all of thestorage devices 500 placed by the robotic arm 200 at another access port410 associated with the collection 600 may all be drives that havefailed the functionality test. In use, the storage devices 500 may beloaded by the robotic arm 200 into the storage device receptacles 620 ofthe collection 600 in a different order and arrangement than they wereunloaded. Similarly, a storage device 500 unloaded by the robotic arm200 from one collection 600 prior to testing may be loaded into adifferent collection 600 after testing. In some examples, a storagedevice 500 unloaded from one transfer station 400 prior to testing isloaded into another transfer station 400 after testing.

FIG. 4A shows a view of the outer plane 402 of the transfer station 400.A collection 600 of storage devices 500 is accessible at one or moreaccess ports 410. In some implementations, each access port 410 mayprovide access to the entire collection 600 or a subset or portion ofthe collection. The collection 600 of storage devices 500 can bearranged so that an open end 624 of each storage device receptacle 620accessible at the access port 410 is accessible for loading andunloading a storage device 500.

In some implementations, multiple access ports 410 are available inproximity to each other. For example, multiple access ports 410 can bearranged in a vertical column 414, as shown, or arranged in a differentconfiguration, such as a horizontal row, a combination of rows orcolumns, or another configuration of access ports 410. Inimplementations where an access port 410 provides access to a portion ofa collection 600, the combination of multiple access ports 410 mayprovide access to the entire collection 600.

In some implementations, the access ports 410 are arranged to beaccessible to a human operator 640. The human operator can load andunload storage devices 500 directly into the storage device receptacles620 of the collection 600 of storage devices. The access ports 410 canbe arranged to be suitable for human use, for example, arranged toaccount for ergonomic factors. For example, the access ports 410 can bearranged within the field of reach of a human operator 640. For example,the in the exemplary configuration of a vertical column 414 of accessports 410, the lower edge 416 of the lowest access port could be aheight 630 of about 50 centimeters off of the ground. The upper edge 418of the highest access port could be a height 632 of about 200centimeters off of the ground.

In some implementations, more than one human operator 640 can access thesame access port 410 simultaneously, for example, to speed up workflowand load or unload more storage devices 500 in a shorter amount of time.

In some implementations, the size and construction of the collection 600and the storage device receptacles 620 is such that a robotic arm 200does not come in contact with a human operator 640. For example, thestorage device receptacles 620 can be long enough to provide a buffer ofspace between the portion accessible to the robotic arm 200 and theportion accessible to the human operator 640.

An access port 410 may have an optional door 412 that can be opened andclosed by a human operator 640. FIG. 4B shows another view of the outerplane 402 of the transfer station 400 in which the door 412 is closed,blocking the collection 600 of storage devices 500 from access. In someimplementations, the door 412 can be used to protect the storage devices500 within from external factors, such as heat, light, and dust, or toisolate the interior of the storage device testing system 100 from thesurrounding environment. For example, the human operator might keep thedoor 412 closed at all times except when loading or unloading storagedevices 500 from the associated access port 410 to protect the drivesfrom those factors.

In some implementations, the status of the door 412 can determineactions of the robotic arm 200. For example, the robotic arm 200 can beconfigured to refrain from loading or unloading storage devices 500 fromthe portion of the collection 600 associated with the door 412 when thedoor is open, indicating that a human operator 640 is in the process ofloading or unloading some of the storage devices. Similarly, the roboticarm 200 can be configured to resume loading and unloading storagedevices 500 when the door 412 is closed. Alternatively, the robotic arm200 can be configured to cease all motion while the door 412 is open.

In some implementations, the door 412 can also be locked and unlocked.For example, the locking capability can be used to control access to thecollection 600 associated with the door. For example, all doors may bekept locked until such time that the collection 600 associated with adoor 412 is ready for service by a human operator. For example, acollection behind a particular door 412 may contain untested storagedevices 500. In such a case, the door 412 may be kept locked until allstorage devices 500 have been transferred to test slots 310. When allstorage devices 500 have been transferred, the door 412 may beautomatically unlocked by the system, to allow a human operator 640 toload new untested storage devices 500. In another example, thecollection 600 associated with a door 412 may contain tested storagedevices 500 that have passed a functionality test. When a human operator640 requests access to passed storage devices, the system may unlockonly that door 412 covering the part of the collection 600 that consistsof passed storage devices. This prevents the human operator 640 frominadvertently removing storage devices from some other part of thecollection 600.

FIG. 4B also shows status indicators 430 associated with a door 412. Thestatus indicators 430 can provide information to a nearby human operator640 about the storage devices 500 in the portion of the collection 600behind the door. For example, the status indicators 430 may indicatethat the storage devices 500 behind the door 412 have been tested, orthat some or all of the storage devices 500 are still awaiting testing.In another example, the status indicators 430 may indicate which storagedevice receptacles 620 behind the door 412 contain storage devices 500and which storage device receptacles 620 behind the door 412 do notcontain storage devices 500. Further, in situations where the storagedevices 500 have been tested, the status indicators 430 may indicatewhether the storage devices 500 have passed the testing and areconsidered “good output,” or that the storage devices 500 have failedthe testing and are considered “bad output.” In implementations in whichthe door 412 is capable of locking and unlocking, the status indicators430 may indicate whether the door 412 is locked or unlocked. In someimplementations, the status indicators 430 may be combined withpushbuttons. In these implementations, pushing a button may signal tothe system that the human operator is requesting access to the storagedevices 500 behind the associated door 412.

The status indicators 430 may take the form of lights (e.g.light-emitting diodes) that light up or flash, for example. In someimplementations, the status indicators may be part of an alphanumericdisplay, for example, a liquid-crystal display.

In some implementations, the door 412 may have a display screen 432instead of or in addition to the status indicators 430. The displayscreen 432 may provide additional information or more details than wouldbe relayed by the status indicators 430 (if present). For example, thedisplay screen 432 may allow a human operator 640 to access or modifythe configuration of the transfer station 400 or the entire testingsystem. The display screen 432 may be a touch screen, for example, ormay have another type of associated control system such as a keyboardand mouse.

In some implementations, the transfer station 400 has a master statusindicator 434 that indicates general information to one or more humanoperators 640 in the vicinity, for example, whether the transfer station400 or the storage device testing system 100 have encountered errorsrequiring human intervention or repair.

FIG. 5 shows an implementation of the storage device receptacle 620 thathas an integrated stop 626. The stop 626 prevents a storage device 500or, in the implementation shown, storage device transporter 550, frombeing pushed too far into the storage device receptacle 620 when thestorage device or transporter is loaded. In some implementations, thedoor 412 may be made of or may include resilient material that pushes628 the storage devices 500 in the collection 600 behind the dooragainst the stop in their respective storage device receptacles 620 whenthe door is closed. In some implementations, the door 412 may includeother mechanisms for pushing the storage devices 500 in the collection600 behind the door against the stop, for example mechanisms that usesprings, rigid mechanical members, or dashpots. Also, in someimplementations, the stop 626 or another component of the storage devicereceptacle 620 is constructed to horizontally and vertically align astorage device 500 when the storage device is inserted in thereceptacle, for example, in functional cooperation with the pushingmechanism of the door.

In some implementations, the door 412, the storage device receptacle620, or another element of the testing system 100 may have one or moredetectors configured to detect the presence and absence of storagedevices 500 within the storage device receptacles 620 of the collection600. For example, the detector could be integrated with the stop 626, orthe detector may be a separate component. The information supplied bythe detector may be used by the status indicators 430 or display screen432 to indicate the presence or absence of the storage devices 500. Insome implementations, the robotic arm 200 may incorporate functionalityto detect the presence or absence of a storage device 500 within thestorage device receptacles 620, for example a camera, bar code scanner,or laser rangefinder.

As shown in FIG. 6, in some implementations, a human operator 640 andthe robotic arm 200 can perform activities simultaneously. For example,the storage device testing system 100 may have multiple transferstations 400 a, 400 b. In one exemplary scenario, the human operatorhas, using an access port 410 at the outer plane 402, loaded storagedevices 500 into one transfer station 400 a for testing. The robotic arm200 now unloads the storage devices, which are also accessible at theinner plane 404, for testing. At the same time as the robotic arm 200unloads storage devices 500, the human operator 640 can load otherstorage devices into the other transfer station 400 b. In anotherexemplary scenario, the robotic arm has already loaded tested storagedevices 500 into the other transfer station 400 b, which the humanoperator 640 unloads while the robotic arm 200 loads or unloads storagedevices 500 in the first transfer station 400 a. In other scenarios, thehuman operator 640 and the robotic arm 200 each load or unload drivesfrom different collections 600 in the same transfer station 400, ordifferent portions of the same collection 600. Other scenarios in whichthe human operator 640 and the robotic arm 200 operate simultaneouslyare possible.

In implementations that employ storage device transporters 550 formanipulating storage devices 500, as shown in FIG. 7, the automatedtransporter 200 is configured to remove a storage device transporter 550from one of the test slots 310 with the manipulator 212, then pick up astorage device 500 from one the collections 600 presented at thetransfer station 400 with the storage device transporter 550, and thenreturn the storage device transporter 550, with a storage device 500therein, to the test slot 310 for testing of the storage device 500.After testing, the automated transporter 200 retrieves the testedstorage device 500 from the test slot 310, by removing the storagedevice transporter 550 carrying the tested storage device 500 from thetest slot 310 (i.e., with the manipulator 212), carrying the testedstorage device 500 in the storage device transporter 550 to the transferstation 400, and manipulating the storage device transporter 550 toreturn the tested storage device 500 to one of the collections 600 atthe transfer station 400.

The test slot 310, shown in FIG. 7, defines an opening 312 configured toreceive the storage device transporter 550, which in this case providesclosure of the test slot 310. The storage device transporter 550 isconfigured to receive the storage device 500, as shown in FIG. 8, and behandled by the automated transporter 200. In use, one of the storagedevice transporters 550 is removed from one of the test slots 310 withthe robotic arm 200 (e.g., by grabbing, or otherwise engaging, theindentation 552 of the transporter 550 with the manipulator 212 of therobot 200). In some examples, as illustrated in FIGS. 8-10, the storagedevice transporter 550 includes a frame 560 defining a substantiallyU-shaped opening 561 formed by sidewalls 562, 564 and a base plate 566that collectively allow the frame 560 to fit around a storage devicesupport (not shown) in the collection 600 so that the storage devicetransporter 550 can be moved (e.g., via the robotic arm 200) into aposition beneath one of the storage devices 500 housed in one ofmultiple storage device receptacles 620 defined by the collection 600(see e.g., FIG. 3). The storage device transporter 550 can then beraised (e.g., by the robotic arm 200) into a position engaging thestorage device 500 for removal from the collection 600.

With the storage device 500 in place within the frame 560 of the storagedevice transporter 550, the storage device transporter 550 and thestorage device 500 together can be moved by the automated transporter200 for placement within one of the test slots 310, as shown in FIG. 4.In some implementations, the manipulator 212 is also configured toinitiate actuation of a clamping mechanism 570 disposed in the storagedevice transporter 550. This allows actuation of the clamping mechanism570 before the transporter 550 is moved from the collection 600 to thetest slot 310 to inhibit movement of the storage device 500 relative tothe storage device transporter 550 during the move. Prior to insertionin the test slot 310, the manipulator 212 can again actuate the clampingmechanism 570 to release the storage device 500 within the frame 560.This allows for insertion of the storage device transporter 550 into oneof the test slots 310, until the storage device 500 is in a testposition with a storage device connector 510 engaged with a test slotconnector (not shown). The clamping mechanism 570 may also be configuredto engage the test slot 310, once received therein, to inhibit movementof the storage device transporter 550 relative to the test slot 310. Insuch implementations, once the storage device 500 is in the testposition, the clamping mechanism 570 is engaged again (e.g., by themanipulator 212) to inhibit movement of the storage device transporter550 relative to the test slot 310. The clamping of the transporter 550in this manner can help to reduce vibrations during testing. In someexamples, after insertion, the storage device transporter 550 andstorage device 500 carried therein are both clamped or secured incombination or individually within the test slot 310.

A detailed description of the robotic arm 200, test slots 310 and otherdetails and features combinable with those described herein may be foundin the following U.S. patent applications, entitled “Disk DriveTesting”, having assigned Ser. No. 11/958,817, entitled “Bulk FeedingDisk Drives To Disk Drive Testing Systems”, having assigned Ser. No.12/104,869, and entitled “Bulk Transfer of Storage Devices Using ManualLoading”, having assigned Ser. No. 61/316,667, the entire contents ofthe aforementioned applications are hereby incorporated by reference.

Other embodiments are within the scope of the following claims.

What is claimed is:
 1. A storage device transfer station of a storagedevice system, comprising: a plurality of slots, with a slot beingcapable of holding a storage device, and with the plurality of slotsarranged in at least one field between two parallel planes; wherein aslot has a first open end and a second open end, the first open end andthe second open end being accessible for loading and for unloading thestorage device; and wherein the first open end is accessible at a firstplane of the two parallel planes and the second open end is accessibleat a second plane of the two parallel planes; wherein the storage devicetransfer station is a component of the storage device system, with thestorage device transfer station being in proximity to (i) one or moreracks of the storage device system, and (ii) an automated transporter ofthe storage device system, and with the storage device transfer stationdiffering from a rack; and wherein the storage device transfer stationis configured for feeding of storage devices to the automatedtransporter of the storage device system.
 2. The storage device transferstation of claim 1, further comprising at least one door covering atleast a portion of the first plane.
 3. The storage device transferstation of claim 2, wherein the at least one door is capable of lockingand unlocking.
 4. The storage device transfer station of claim 3,wherein the at least one door is capable of automatic locking andunlocking.
 5. The storage device transfer station of claim 1, furthercomprising a plurality of doors, wherein the first plane is covered bythe plurality of doors.
 6. The storage device transfer station of claim1, wherein at least one of the slots is arranged to align the storagedevice in at least one of vertical and horizontal directions.
 7. Thestorage device transfer station of claim 2, wherein at least one of theslots comprises a stop.
 8. The storage device transfer station of claim7, wherein the at least one door comprises a mechanism to push thestorage device against the stop when the at least one door is closed. 9.The storage device transfer station of claim 1, wherein the plurality ofslots are arranged to receive the storage device at the first plane froma human operator.
 10. The storage device transfer station of claim 1,wherein the plurality of slots are arranged to provide the storagedevice at the second plane to automated machinery.
 11. The storagedevice transfer station of claim 1, wherein the plurality of slots arearranged to prevent contact between a human operator and automatedmachinery.
 12. The storage device transfer station of claim 1, furthercomprising at least one door covering at least a portion of the firstplane, and configured to signal automated machinery to restrict movementwhile the at least one door is open.
 13. The storage device transferstation of claim 1, wherein the at least one field comprises at least125 slots.
 14. The storage device transfer station of claim 1, whereinthe at least one field comprises one or more vertically stacked rows.15. A storage device testing system, comprising: a plurality of racks; astorage device transfer station comprising: a plurality of slots, with aslot being capable of holding a storage device, and with the pluralityof slots arranged in a field between two parallel planes; wherein a slothas a first open end and a second open end, the first open end and thesecond open end being accessible for loading and for unloading thestorage device; and wherein the first open end is accessible at a firstplane of the two parallel planes and the second open end is accessibleat a second plane of the two parallel planes; and automated machineryconfigured to access the second open end of the slot in the plurality ofslots; wherein the storage device transfer station is in proximity to(i) the plurality of racks of the storage device testing system, and(ii) the automated machinery of the storage device testing system, withthe storage device transfer station differing from a rack; and whereinthe storage device transfer station is configured for feeding of storagedevices to the automated machinery of the storage device testing system.16. The storage device testing system of claim 15, further comprising atleast one door covering at least a portion of the first plane.
 17. Thestorage device transfer station of claim 16, wherein the at least onedoor is configured to signal the automated machinery to restrictmovement while the at least one door is open.
 18. The storage devicetesting system of claim 16, wherein the at least one door is capable oflocking and unlocking.
 19. The storage device testing system of claim18, wherein the at least one door is capable of automatic locking andunlocking.
 20. The storage device testing system of claim 15, whereinthe storage device transfer station further comprises a plurality ofdoors, and wherein the first plane is covered by the plurality of doors.21. The storage device testing system of claim 15, wherein at least oneof the slots is arranged to align the storage device in at least one ofvertical and horizontal directions.
 22. The storage device testingsystem of claim 16, wherein at least one of the slots comprises a stop.23. The storage device testing system of claim 22, wherein the at leastone door comprises a mechanism to push the storage device against thestop when the at least one door is closed.
 24. The storage devicetesting system of claim 15, wherein the plurality of slots is arrangedto receive the storage device at the first plane from a human operator.25. The storage device transfer station of claim 15, wherein the slot isarranged to prevent contact between a human operator and the automatedmachinery.
 26. The storage device testing system of claim 15, whereinthe field comprises at least 125 slots.
 27. The storage device testingsystem of claim 15, wherein the field comprises one or more verticallystacked rows.
 28. The storage device transfer station of claim 1,wherein the first open end and the second open end being accessible forloading and for unloading the storage device comprises: the first openend and the second open end each being accessible for loading and forunloading multiple storage devices simultaneously at a same time. 29.The storage device transfer station of claim 1, further comprising: anaccess port allowing an operator to load a plurality of first storagedevices into the storage device system and to unload a plurality ofsecond storage devices from the storage device system.